Two decades of Innovation

In 2004, Si-Ware was founded by leading-edge scientists and entrepreneurs who developed the first alignment-free, calibration-free, and shock-resistant Fourier Transform-IR module on a chip. These innovative modules were integrated into OEM systems for material-analysis applications in environmental, healthcare, agriculture, food and beverage, industrial, pharmaceuticals, petrochemicals, and law enforcement industries.

Just ten years later, Si-Ware won the 2014 Prism Award from the International Society for Optics and Photonics (SPIE) for our first generation technology. Since then, Si-Ware has continued to innovate and garner approval for technology and solutions. In addition to scoring dozens of patents, Si-Ware has published scores of research papers that represent our technical advancements in FT-NIR. Si-Ware, an independent fabless semiconductor company that fosters silicon innovation, is headquartered in Menlo Park, California, with research and development centers in Paris, France and Cairo, Egypt. Si-Ware’s end to end NeoSpectra solution, which combines portable FT NIR Analyzers with intuitive software and a powerful cloud to quickly analyze samples with speed and precision across almost all industries, has evolved over two decades of innovation.

Si-Ware brings highly accurate, on-site material analysis within reach for all through affordable and accessible technology. We have redefined NIR performance and use through unique FT-NIR technology that enables simultaneous analysis of multiple parameters with greater accuracy, across practically all industries and scientific applications.